Ozone Mapping Profiler Suite (OMPS) SIPS
OMPS SIPS
NASA's Ozone Mapping Profiler Suite (OMPS) Science Investigator-led Processing System (SIPS) is responsible for processing and reprocessing the joint NASA/NOAA Suomi-NPP Ozone Mapping Profiler Suite (OMPS) Nadir Products. The science measurements may include products such as OMPS total column, total column earth view, total column calibration, nadir profile Earth view, and nadir profile calibration. OMPS SIPS is responsible for the production and general quality assessment of OMPS Nadir products. It processes Level 0 data to Level 1, Level 2, and global gridded Level 3 nadir products using the scientific algorithm software from the Suomi-NPP science team’s Ozone Discipline Group. OMPS SIPS delivers all data products along with scientific algorithm software, associated metadata, and documentation to the OMPS website and NASA's Goddard Earth Sciences Data Information Services Center (GES DISC). OMPS SIPS acquires near real-time algorithms for selected products and processes and delivers these products within three hours for distribution through NASA's Land, Atmosphere Near real-time Capability for EOS (LANCE).
Contact Information
Evelyn Ho, NASA Official
EOSDIS SIPS
NASA's Earth Science Data and Information System (ESDIS) Project supports data processing by providing SIPS. Most of NASA's Earth Observing System (EOS) standard products are produced at facilities under the direct control of the instrument Principal Investigators/Team Leaders (PIs/TLs) or their designees. The SIPS are geographically distributed across the United States and are generally, but not necessarily, collocated with the PIs/TLs’ Scientific Computing Facilities (SCFs). Products produced at the SIPS using investigator-provided systems and software are sent to the appropriate DAACs for archival and distribution. Level 0 Data Products and Ancillary Data that begin the processing sequence are stored at the DAACs and retrieved by the SIPS.
Links
Last Updated: Jun 14, 2019 at 11:19 AM EDT
